IEC IEC61788-15 Edition 1.02011-10 BB INTERNATIONAL STANDARD NORME INTERNATIONALE colour nside Superconductivity Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductorfilmsatmicrowavefrequencies Supraconductivite- Partie15:Mesuresdecaracteristiquesélectroniques-Impedancedesurface intrinsequedefilmssupraconducteursauxfrequencesmicro-ondes IEC 61788-15:2011 material IEC IEC 61788-15 licer ensed to BR Demo by Thomson Reuters ( Edition1.0 2011-10 INTERNATIONAL STANDARD NORME (Scientific). INTERNATIONALE Inc. colour inside tech Superconductivity- Part 15:Electronic characteristic measurements -Intrinsic surface impedance of superconductorfilms at microwavefrequencies Supraconductivite- on Partie 15:Mesures decaracteristiques électroniques-Impedance de surface intrinsequedefilmssupraconducteursauxfrequencesmicro-ondes No further INTERNATIONAL ELECTROTECHNICAL COMMISSION tion COMMISSION or ELECTROTECHNIQUE INTERNATIONALE PRICECODE X CODEPRIX ICS 29.050 ISBN 978-2-88912-710-8 Uncontrolled @ Registered trademark of the International Electrotechnical Commission Marque deposee de la Commission Electrotechnique Internationale ed material 61788-15@IEC:2011 2 CONTENTS FOREWORD INTRODUCTION.. .6 Demo Scope. Normative references 2 3 Terms and definitions .. 4 Requirements.. Reuters 5 Apparatus.. 5.1 Measurement equipment. 5.2 Measurement apparatus... 5.3 Dielectric rods 13 5.4 Superconductor films and copper cavity 14 Inc. Measurement procedure.. 14 6 6.1 Set-up.... 6.2 Measurement of the reference level. 6.3 Measurement of the Rs of oxygen-free high purity copper ... 14 6.4 Determination of the effective Rs of superconductor films and tano of standard dielectric rods ... 6.5 Determination of the penetration depth. 6.6 Determination of the intrinsic surface impedance.. Uncertainty of the test method.. 7.1 Measurement ofunloaded qualityfactor 7.2 Measurement of loss tangent.. 7.3 Temperature.. 7.4 Specimen and holder support structure 22 Test Report .. 8 22 8.1 Identification of test specimen .. .22 8.2 Report of the intrinsic Zs values . .22 8.3 Report of the test conditions... Annex A (informative)Additional information relating to clauses 1to 8 .24 AnnexB(informative)Uncertainty considerations 41 Bibliography.. No Figure 1-Schematic diagram for the measurement equipment for the intrinsic Zs of 10 Figure 2-Schematic diagram of a dielectric resonatorwith a switch forthermal connection. 10 Figure 3-Typical dielectric resonator with a movable top plate. 11 Figure 4-Switch block for thermal connection .. Figure 5-Dielectric resonatorassembled with a switch block for thermal connection.. 13 tion Figure 6-A typical resonance peak. Insertion attenuation IA, resonant frequency fo and half power bandwidth AfsdB are defined.... .16 Figure 7 - Reflection scattering parameters S11 and S22 18 ted .22 Figure 8-Definitions for terms in Table 5 ... Figure A.1-Schematic diagramforthemeasurement system. Figure A.2-A motion stageusing stepmotors. when